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Raman Imaging
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Editor(s):
Arnaud Zoubir
Publication date
(Print):
2012
Publisher:
Springer Berlin Heidelberg
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Electron Channelling Contrast Imaging (ECCI)
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Book
ISBN (Print):
978-3-642-28251-5
ISBN (Electronic):
978-3-642-28252-2
Publication date (Print):
2012
DOI:
10.1007/978-3-642-28252-2
SO-VID:
4ee95bb7-e89a-43f3-ad5d-c6af807c8dd1
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http://www.springer.com/tdm
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Book chapters
pp. 1
Imaging Modes
pp. 39
Raman Imaging in Semiconductor Physics: Applications to Microelectronic Materials and Devices
pp. 85
Raman Mapping for the Investigation of Nano-phased Materials
pp. 119
Raman Imaging of Micro- and Nano-Structured Materials
pp. 145
Application of Raman-based images in the Earth sciences
pp. 189
Raman Mapping in the Scientific Investigations of Works of Art
pp. 219
Raman Microscopy : A Versatile Approach to Bio-Imaging
pp. 243
Mapping Chemical and Structural Composition of Pharmaceutical and Biological Samples by Raman, Surface-Enhanced Raman and Fluorescence Spectral Imaging
pp. 257
Raman Imaging of Grain Orientation, Strain, Crystallinity and Doping Levels in Solar Silicon
pp. 301
Tip-Enhanced Near-Field Optical Microscopy of Carbon Nanotubes
pp. 317
CARS Microscopy: Implementation of Nonlinear Vibrational Spectroscopy for Far-Field and Near-Field Imaging
pp. 347
Background-free Coherent Raman Imaging: The CARS and SRS Contrast Mechanisms
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