Home
Journals
Archaeology International
Architecture_MPS
Europe and the World: A law review
Film Education Journal
History Education Research Journal
International Journal of Development Education and Global Learning
International Journal of Social Pedagogy
Jewish Historical Studies: A Journal of English-Speaking Jewry
Journal of Bentham Studies
London Review of Education
Radical Americas
Research for All
The Journal of the Sylvia Townsend Warner Society
The London Journal of Canadian Studies
About
About UCL Press
Who we are
Contact us
My ScienceOpen
Sign in
Register
Dashboard
Search
Home
Journals
Archaeology International
Architecture_MPS
Europe and the World: A law review
Film Education Journal
History Education Research Journal
International Journal of Development Education and Global Learning
International Journal of Social Pedagogy
Jewish Historical Studies: A Journal of English-Speaking Jewry
Journal of Bentham Studies
London Review of Education
Radical Americas
Research for All
The Journal of the Sylvia Townsend Warner Society
The London Journal of Canadian Studies
About
About UCL Press
Who we are
Contact us
My ScienceOpen
Sign in
Register
Dashboard
Search
14
views
0
references
Top references
cited by
0
Cite as...
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
3,408
similar
All similar
Record
: found
Abstract
: found
Book
: found
Material Characterization Using Ion Beams
other
Editor(s):
J. P. Thomas
,
A. Cachard
Publication date
(Print):
1978
Publisher:
Springer US
Read this book at
Publisher
Buy book
Review
Review book
Invite someone to review
Bookmark
Cite as...
There is no author summary for this book yet. Authors can add summaries to their books on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Genome Engineering using CRISPR
Author and book information
Book
ISBN (Print):
978-1-4684-0858-4
ISBN (Electronic):
978-1-4684-0856-0
Publication date (Print):
1978
DOI:
10.1007/978-1-4684-0856-0
SO-VID:
3f04f881-3730-4066-b96a-26bc74149ad2
History
Data availability:
Comments
Comment on this book
Sign in to comment
Book chapters
pp. 3
Energy Loss of Charged Particles
pp. 143
Fundamental Aspects of Ion Microanalysis
pp. 303
Backscattering of Ions with Intermediate Energies
pp. 333
Backscattering Analysis with MeV 4He Ions
pp. 455
Analysis of Defects by Channeling
Similar content
3,408
Accuracy Assessment of Three-dimensional Surface Reconstructions of In vivo Teeth from Cone-beam Computed Tomography
Authors:
Yan-Hui Sang
,
Hong-Cheng Hu
,
Song-He Lu
…
Accuracy of in-vitro tooth volumetric measurements from cone-beam computed tomography.
Authors:
Junjie XUE
,
Jingtao Li
,
FAN JIAN
…
Cone beam computed tomography findings as prognostic factors for maxillary sinus membrane perforation during maxillary sinus augmentation
Authors:
Yifat Manor
,
Aya Khadija
,
Lazar Kats
See all similar