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      Catalyst Characterization 

      Secondary Ion Mass Spectrometry

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      Springer US

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          Atomic and Ionic Impact Phenomena on Metal Surfaces

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            Developments in secondary ion mass spectroscopy and applications to surface studies

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              Evaluation of a cesium positive ion source for secondary ion mass spectrometry

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                Book Chapter
                1994
                : 291-319
                10.1007/978-1-4757-9589-9_11
                f6f4844c-9b72-4a81-8f26-b2aab5855d6c
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