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ISBN (Print): 978-3-642-46501-7

ISBN (Electronic): 978-3-642-46499-7

Publication date (Print): 1984

DOI: 10.1007/978-3-642-46499-7

SO-VID: c2ee9fd7-4556-482d-995d-779745b66bed

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http://www.springer.com/tdm

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Cited by 12

Depth Profile Studies Using Laser-Induced Plasma Emission Spectrometry
Authors: David R Anderson, Cameron W. McLeod, Tim English …
Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films
Authors: T. Nunney, H. Dijkstra, V. Hoffmann …
Model study of keV-ion mixing of metallic interfaces: Influence of materials properties and deposited energy
Authors: Heinrich Gades, Herbert M. Urbassek

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Thin Film and Depth Profile Analysis

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