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ISBN (Print): 978-3-540-03405-6

ISBN (Electronic): 978-3-540-37140-3

Publication date (Print): 1965

DOI: 10.1007/BFb0045736

SO-VID: c5be32ec-720d-4a6e-b454-bc00280a713d

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http://www.springer.com/tdm

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Cited by 1

Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si
Authors: J. Pierron, M. Raine, J Puech …

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Springer Tracts in Modern Physics, Volume 38

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