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Archaeology International
Architecture_MPS
Europe and the World: A law review
Film Education Journal
History Education Research Journal
International Journal of Development Education and Global Learning
International Journal of Social Pedagogy
Jewish Historical Studies: A Journal of English-Speaking Jewry
Journal of Bentham Studies
London Review of Education
Radical Americas
Research for All
The Journal of the Sylvia Townsend Warner Society
The London Journal of Canadian Studies
About UCL Press
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      Materials and Processes of Electron Devices : Werkstoffe und Verfahren zur Herstellung von Entladungsgeräten / Matériaux et procédés pour la construction d’appareils de décharges électriques / Materiales y procesos de fabricación para elementos electrónicos 

      Testing Methods for Vacuum Tube Materials

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      Publisher: Springer Berlin Heidelberg

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          A Mass Spectrometer for Routine Isotope Abundance Measurements

          Alfred O. Nier (1940)
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            The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films

            Alexandre Rothen (1945)
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              The annealing of glass

              L.H. Adams, E.D Williamson (1920)
              Article 0 comments Cited 20 times – based on 0 reviews     Review now
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                Publication date (Print): 1959
                Pages: 20-56
                DOI: 10.1007/978-3-642-45936-8_3
                SO-VID: 15cf6442-2953-49ff-9ddd-2b7ff0c3b488
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