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Archaeology International
Architecture_MPS
Europe and the World: A law review
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Journal of Bentham Studies
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Research for All
The Journal of the Sylvia Townsend Warner Society
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Material Characterization Using Ion Beams
other
Editor(s):
J. P. Thomas
,
A. Cachard
Publication date
(Print):
1978
Publisher:
Springer US
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Author and book information
Book
ISBN (Print):
978-1-4684-0858-4
ISBN (Electronic):
978-1-4684-0856-0
Publication date (Print):
1978
DOI:
10.1007/978-1-4684-0856-0
SO-VID:
3f04f881-3730-4066-b96a-26bc74149ad2
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Book chapters
pp. 3
Energy Loss of Charged Particles
pp. 143
Fundamental Aspects of Ion Microanalysis
pp. 303
Backscattering of Ions with Intermediate Energies
pp. 333
Backscattering Analysis with MeV 4He Ions
pp. 455
Analysis of Defects by Channeling
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