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      Kombination von Beobachtungsverfahren

      other
      Springer Berlin Heidelberg

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          Kristallbaufehler beim epitaxialen Wachstum von Silizium auf Magnesium–Aluminium-Spinell

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            Epitaxiales Wachstum von Silbersulfid auf dünnen Silberschichten

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              Der Einfluss Von Gitterdefekten Un Mechanischen Spannungen Auf Das Ätzverhalten Von Silizium

              H Seiter (1967)
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                1969
                : 159-183
                10.1007/978-3-642-92986-1_8
                57d95709-a861-40f7-9d55-42f899c9f675
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