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Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen
Oberflächen-Elektronenmikroskopie
other
Author(s):
J. Heydenreich
,
H. Johansen
Publication date
(Print):
1979
Publisher:
Vieweg+Teubner Verlag
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Book Chapter
Publication date (Print):
1979
Pages
: 235-262
DOI:
10.1007/978-3-322-83622-9_11
SO-VID:
b4213d16-5d26-4b13-afe1-5e1b8e3afa8c
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Book chapters
pp. 9
Einführung
pp. 25
Röntgendiffraktometrie
pp. 57
Röntgentopographie
pp. 81
Röntgenfluoreszenzanalyse
pp. 99
Elektronenstrahl-Mikroanalyse
pp. 131
Hochauflösende Röntgenspektroskopie
pp. 149
Festkörperanalyse mittels ioneninduzierter Röntgenstrahlung
pp. 165
Beugung schneller Elektronen (HEED)
pp. 185
Beugung langsamer Elektronen (LEED)
pp. 209
Durchstrahlungs-Elektronenmikroskopie
pp. 235
Oberflächen-Elektronenmikroskopie
pp. 263
Feldemissionsmikroskopie
pp. 281
Energieverlust-Elektronenspektroskopie
pp. 295
Auger-Elektronenspektroskopie
pp. 315
Photoelektronenspektroskopie
pp. 335
Ioneninduzierte Elektronenemission
pp. 345
Ionenreflexionsspektroskopie
pp. 357
Ionometrie
pp. 373
Sekundärionen-Massenspektroskopie
pp. 399
Elektronenstimulierte Ionendesorption
pp. 407
Rechnersteuerung, Datenerfassung und Auswertung
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