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ISBN (Print): 1-4020-8003-4

Publication date (Print): 2005

DOI: 10.1007/1-4020-8006-9

SO-VID: f4d932a5-9783-4991-8016-05e975923d34

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http://www.springer.com/tdm

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Cited by 6

Richardson Number Ratio Effect on Laminar Mixed Convection of a Nanofluid Flow in an Annulus
Authors: M. Izadi, M. M. Shahmardan, A. Behzadmehr
Mapping electrostatic profiles across axial p-n junctions in Si nanowires using off-axis electron holography
Authors: Zhaofeng Gan, Daniel Perea, Jinkyoung Yoo …
Investigation of surface defect states in CeO2-y nanocrystals by Scanning−tunneling microscopy/spectroscopy and ellipsometry
Authors: Ivana Veljkovic, Zorana Dohcevic-Mitrovic, Bojan Stojadinović …

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Handbook of Microscopy for Nanotechnology

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