Characterization of Dislocation Densities in Germanium and Silicon Single Crystals by High Resolution X-Ray Diffraction

Sous, S. A.; Hildmann, B. O.; Kaysser, W. A.

doi:10.1002/1521-396X(199702)159:2<343::AID-PSSA343>3.0.CO;2-#

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Characterization of Dislocation Densities in Germanium and Silicon Single Crystals by High Resolution X-Ray Diffraction

Author(s): S. A. Sous , B. O. Hildmann , W. A. Kaysser

Publication date Created: February 1997

Publication date (Print): February 1997

Journal: physica status solidi (a)

Publisher: Wiley

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Most cited references 21

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Precision lattice constant determination

W. L. Bond (1960)

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The estimation of dislocation densities in metals from X-ray data

P.B Hirsch, P. Gay, A. Kelly (1953)

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The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction

J.E. Ayers (1994)

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Journal

Title: physica status solidi (a)

Abbreviated Title: phys. stat. sol. (a)

Publisher: Wiley

ISSN (Print): 00318965

ISSN (Electronic): 1521396X

Publication date Created: February 1997

Publication date (Print): February 1997

Volume: 159

Issue: 2

Pages: 343-353

Article

DOI: 10.1002/1521-396X(199702)159:2<343::AID-PSSA343>3.0.CO;2-#

SO-VID: 31d1228d-438d-47a8-900b-1a09e8b4efaa

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http://doi.wiley.com/10.1002/tdm_license_1.1

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