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      Materials processing routes to trap-free halide perovskites.

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          Abstract

          Photovoltaic devices based on lead iodide perovskite films have seen rapid advancements, recently achieving an impressive 17.9% certified solar power conversion efficiency. Reports have consistently emphasized that the specific choice of growth conditions and chemical precursors is central to achieving superior performance from these materials; yet the roles and mechanisms underlying the selection of materials processing route is poorly understood. Here we show that films grown under iodine-rich conditions are prone to a high density of deep electronic traps (recombination centers), while the use of a chloride precursor avoids the formation of key defects (Pb atom substituted by I) responsible for short diffusion lengths and poor photovoltaic performance. Furthermore, the lowest-energy surfaces of perovskite crystals are found to be entirely trap-free, preserving both electron and hole delocalization to a remarkable degree, helping to account for explaining the success of polycrystalline perovskite films. We construct perovskite films from I-poor conditions using a lead acetate precursor, and our measurement of a long (600 ± 40 nm) diffusion length confirms this new picture of the importance of growth conditions.

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          Author and article information

          Journal
          Nano Lett.
          Nano letters
          1530-6992
          1530-6984
          Nov 12 2014
          : 14
          : 11
          Affiliations
          [1 ] Department of Electrical and Computer Engineering, The University of Toronto , Toronto, ON M5S 3G4, Canada.
          Article
          10.1021/nl502612m
          25296282
          5cdb95c4-f6c6-4553-9af2-e5cb36adfb99
          History

          Perovskite,defect,diffusion length,electronic traps,growth,precursor

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