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ISBN (Print): 978-3-642-81209-5

ISBN (Electronic): 978-3-642-81207-1

Publication date (Print): 1978

DOI: 10.1007/978-3-642-81207-1

SO-VID: 9f1e5f3f-94d5-4c19-9ff1-a566e512ad30

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http://www.springer.com/tdm

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X-ray interference in ultrathin epitaxial layers: A versatile method for the structural analysis of single quantum wells and heterointerfaces
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